DocumentCode :
3691288
Title :
Infrared ellipsometric spectroscopy of Mn1.56Co0.96Ni0.48O4 thin films with different layers
Author :
Yanqing Gao;Zhiming Huang;Yun Hou;Jing Wu;Wei Zhou;Cheng Ouyang;Junhao Chu
Author_Institution :
National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Science, Shanghai, 200083, China
fYear :
2015
Firstpage :
1
Lastpage :
2
Abstract :
High quality Mn1.56Co0.96Ni0.48O4 films with different layers have been prepared on Pt//Ti/SiO2/Si substrate. Infrared optical properties of the films have been investigated using infrared spectroscopic ellipsometry. The optical constants have been obtained by fitting the measured ellipsometric parameter data with classical infrared model.
Keywords :
"Optical films","Optical refraction","Optical variables control","Optical detectors","Temperature measurement"
Publisher :
ieee
Conference_Titel :
Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2015 40th International Conference on
ISSN :
2162-2027
Electronic_ISBN :
2162-2035
Type :
conf
DOI :
10.1109/IRMMW-THz.2015.7327441
Filename :
7327441
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3691288
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