Title :
Accurate material parameter extraction from broadband terahertz spectroscopy
Author :
N. R. Greenall;C. D. Wood;C. Russell;L. H. Li;E. H. Linfield;A. G. Davies;J. E. Cunningham;A. D. Burnett
Author_Institution :
School of Electronic and Electrical Engineering, University of Leeds, LS2 9JT, United Kingdom
Abstract :
We demonstrate how a transfer function model based parameter extraction method, combined with total variance analysis, allows the extraction of both the complex refractive index and the thickness of a sample over a bandwidth of >6 THz from THz time-domain spectroscopy measurements. We discuss how the techniques developed have been applied to absorbent powders measured at variable low temperatures.
Keywords :
"Temperature measurement","Thickness measurement","Spectroscopy","Bandwidth","Time-domain analysis","Silicon","Refractive index"
Conference_Titel :
Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2015 40th International Conference on
Electronic_ISBN :
2162-2035
DOI :
10.1109/IRMMW-THz.2015.7327467
