Title :
Vector characterization of a focused terahertz beam
Author :
Xinke Wang;Sen Wang;Yan Zhang
Author_Institution :
Department of Physics, Capital Normal University, XiSanHuan BeiLu No.105, Beijing 100048, China
Abstract :
Vectorial properties of a focused terahertz (THz) beam are measured by using a THz digital holographic imaging system. The THz transverse and longitudinal polarization components around the focal point are obtained utilizing the detection crystals with different crystalline orientations. This imaging technique provides an effective method for presenting the vector diffraction process of the THz wave.
Keywords :
"Crystals","Lenses","Diffraction","Silicon","Probes","Optical imaging"
Conference_Titel :
Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2015 40th International Conference on
Electronic_ISBN :
2162-2035
DOI :
10.1109/IRMMW-THz.2015.7327607
