DocumentCode
3691453
Title
Vector characterization of a focused terahertz beam
Author
Xinke Wang;Sen Wang;Yan Zhang
Author_Institution
Department of Physics, Capital Normal University, XiSanHuan BeiLu No.105, Beijing 100048, China
fYear
2015
Firstpage
1
Lastpage
2
Abstract
Vectorial properties of a focused terahertz (THz) beam are measured by using a THz digital holographic imaging system. The THz transverse and longitudinal polarization components around the focal point are obtained utilizing the detection crystals with different crystalline orientations. This imaging technique provides an effective method for presenting the vector diffraction process of the THz wave.
Keywords
"Crystals","Lenses","Diffraction","Silicon","Probes","Optical imaging"
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2015 40th International Conference on
ISSN
2162-2027
Electronic_ISBN
2162-2035
Type
conf
DOI
10.1109/IRMMW-THz.2015.7327607
Filename
7327607
Link To Document