Title :
Optimization of probe capability using MPCps
Author :
Wiljelm Carl K. Olalia
Author_Institution :
ON Semiconductor Philippines Incorporated, Golden Mile Business Park SEZ, Governor´s Drive, Carmona, Cavite, 4116
Abstract :
Based on the MPCpS, it has been concluded that Probe Damage Occurrence at Prober X using blade type needle are caused by Capability Limitation. Set-up constraint is the reason for Capability issue. Optimum Setting determined from Stage 4 has been immediately implemented. There is a Characterization made separately for checking of consequential effect since the contact during Probing is being decreased approximately 1 mil. Implementation of the change in over travel setting resulted to significant decrease in terms of Probe Damage ppm.
Keywords :
"Probes","Needles","Blades","Optimization","Current measurement","Joints","Business"
Conference_Titel :
Joint e-Manufacturing and Design Collaboration Symposium (eMDC) & 2015 International Symposium on Semiconductor Manufacturing (ISSM), 2015