• DocumentCode
    3691956
  • Title

    Six sigma approach of eliminating device trimming issue

  • Author

    Wiljelm Carl K. Olalia;Rex F. Bullag;Carlo C. Reyes

  • Author_Institution
    ON Semiconductor Philippines Incorporated, Golden Mile Business Park SEZ, Governor´s Drive, Carmona, Cavite, 4116
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Trimming is a test methodology wherein blowing of fuse which is parallel to a resistor to attain the expected output voltage of a DUT as shown in Figure 1. A trim attempt is a condition that the program inject a surge of current to a particular connecting fuse to attain the require output reading on device parameter.
  • Keywords
    "Probes","Fuses","Contact resistance","Joining processes","Needles","Market research","Object recognition"
  • Publisher
    ieee
  • Conference_Titel
    Joint e-Manufacturing and Design Collaboration Symposium (eMDC) & 2015 International Symposium on Semiconductor Manufacturing (ISSM), 2015
  • Type

    conf

  • Filename
    7328916
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3691956