Title :
Six sigma approach of eliminating device trimming issue
Author :
Wiljelm Carl K. Olalia;Rex F. Bullag;Carlo C. Reyes
Author_Institution :
ON Semiconductor Philippines Incorporated, Golden Mile Business Park SEZ, Governor´s Drive, Carmona, Cavite, 4116
Abstract :
Trimming is a test methodology wherein blowing of fuse which is parallel to a resistor to attain the expected output voltage of a DUT as shown in Figure 1. A trim attempt is a condition that the program inject a surge of current to a particular connecting fuse to attain the require output reading on device parameter.
Keywords :
"Probes","Fuses","Contact resistance","Joining processes","Needles","Market research","Object recognition"
Conference_Titel :
Joint e-Manufacturing and Design Collaboration Symposium (eMDC) & 2015 International Symposium on Semiconductor Manufacturing (ISSM), 2015
