DocumentCode
3692347
Title
Ultrasonic flaw detection using Support Vector Machine classification
Author
Kushal Virupakshappa;Erdal Oruklu
Author_Institution
Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, USA
fYear
2015
Firstpage
1
Lastpage
4
Abstract
In this work, a Support Vector Machine (SVM) classifier is introduced for ultrasonic flaw detection based on features extracted from the output of the subband decomposition filters. SVM is a machine learning method used for classification and regression analysis of complex real-world problems that may be difficult to analyze theoretically. A dataset constituting feature vectors of ultrasonic signals containing flaw and no flaw, is created in order to train and test the SVM. A k-fold cross validation technique is then performed to choose the best parameters for classification. Experimental results, using A-scan data measurements from a steel block, show that a very high classification accuracy can be achieved. Robust performance of the classifier is due to proper selection of frequency-diverse feature vectors and successful training.
Keywords
"Support vector machines","Training","Acoustics","Testing","Accuracy","Classification algorithms","Clutter"
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2015 IEEE International
Type
conf
DOI
10.1109/ULTSYM.2015.0128
Filename
7329337
Link To Document