DocumentCode
3692355
Title
SAW characteristics of AlN/SiO2 /3C-SiC layered structure with embedded electrodes
Author
Qiaozhen Zhang;Tao Han;Gongbin Tang;Jing Chen;Ken-ya Hashimoto
Author_Institution
Department of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, China
fYear
2015
Firstpage
1
Lastpage
4
Abstract
A novel sandwich structure of AlN/SiO2/3C-SiC with embedded electrodes, which enables the growth of highly quality AlN thin films, is proposed and studied. The phase velocity, coupling factor, and temperature coefficient of frequency (TCF) of SAWs in the proposed structure have been investigated using the finite element method (FEM). The simulation results show that high velocity of 5,485m/s and large effective coupling factor of 1.45% can be simultaneously obtained, which is about 3.4 times larger than the value previously reported. The excellent zero TCF is also achieved without deteriorating the coupling factor by adding the SiO2 overlay.
Keywords
"Aluminum nitride","Electrodes","III-V semiconductor materials","Couplings","Temperature","Surface acoustic waves","Surface acoustic wave devices"
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2015 IEEE International
Type
conf
DOI
10.1109/ULTSYM.2015.0116
Filename
7329346
Link To Document