Title :
Evaluation of acoustic properties of (K,Na)NbO3 film
Author :
Ryosuke Kaneko;Micho Kadota;Yuji Ohashi;Jun-ichi Kushibiki;Shinsuke Ikeuchi;Shuji Tanaka
Author_Institution :
Graduate school, Tohoku University, Sendai, Miyagi, Japan
Abstract :
Currently, it is required to develop lead-free piezoelectric thin film materials such as (K,Na)NbO3 (KNN) for a substitute of Pb(Zr,Ti)O3 (PZT). However, the material constants of a KNN film have not been reported yet. In this paper, some material constants of a KNN film are presented for the first time. We fabricated some piezoelectric resonators using a blanket KNN film by MEMS (micro electro mechanical systems) technology, and obtained the following material constants and related values; s11E = 9.27 pm2/N, s12E = -3.06 pm2/N, s66E = 24.7 pm2/N, c33E = 2.89 GPa, k312 = 0.06%, kt2 = 2.08%, d31 = -78.9 pC/N, Poison ratio σE = 0.33, and e33T/ε0 = 1.27×103. We also measured the velocities of leaky Lamb wave in a KNN diaphragm covered with Al using a line-focus-beam ultrasonic material characterization (LFB-UMC) system. Phase velocities of 1491 m/s and 5370-5180 m/s were measured for antisymmetric (A0) and symmetric (S0) modes of leaky Lamb wave, respectively. This is an important step to the determination of full material constants of the KNN film.
Keywords :
"Micromechanical devices","Magnetic films","Transducers","Silicon","Etching","Milling"
Conference_Titel :
Ultrasonics Symposium (IUS), 2015 IEEE International
DOI :
10.1109/ULTSYM.2015.0139