DocumentCode :
3692766
Title :
AYUSH: Extending Lifetime of SRAM-NVM Way-Based Hybrid Caches Using Wear-Leveling
Author :
Sparsh Mittal;Jeffrey S. Vetter
Author_Institution :
Oak Ridge Nat. Lab., Oak Ridge, TN, USA
fYear :
2015
Firstpage :
112
Lastpage :
121
Abstract :
The features and limitations of both SRAM and NVM (non-volatile memory) technologies have led the researchers to study SRAM-NVM way-based hybrid last level caches (LLCs). Since large leakage power consumption of SRAM allows including only few SRAM ways, the small write-endurance of NVM may still lead to small lifetime of these hybrid caches. We propose AYUSH, a technique for improving lifetime of SRAM-NVM hybrid caches. AYUSH uses data-migration approach to preferentially utilize SRAM for storing write-intensive data. Microarchitectural simulations have shown that AYUSH provides larger improvement in lifetime than three previous techniques. For single, dual and quad-core system configurations, the average increase in cache lifetime with AYUSH is 6.90×, 24.06× and 47.62×, respectively. Also, it does not harm performance or energy efficiency and works well for a range of system and algorithm parameters.
Keywords :
"Random access memory","Nonvolatile memory","Program processors","Memory management","Radiation detectors","Computational modeling","Analytical models"
Publisher :
ieee
Conference_Titel :
Modeling, Analysis and Simulation of Computer and Telecommunication Systems (MASCOTS), 2015 IEEE 23rd International Symposium on
ISSN :
1526-7539
Type :
conf
DOI :
10.1109/MASCOTS.2015.29
Filename :
7330180
Link To Document :
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