DocumentCode :
3692892
Title :
MM-wave noise measurements under nonlinear conditions
Author :
J. Martens
Author_Institution :
Anritsu Company, Morgan Hill CA 95037 US
fYear :
2015
Firstpage :
1
Lastpage :
3
Abstract :
Among a class of noise measurements of interest are those where a (pseudo-)deterministic drive is applied to a DUT and the noise power, in some spectral sub-region, or more generally, is measured. As higher power mm-wave applications proliferate, that measurement type becomes increasingly of interest at higher frequencies where wider bandwidth analyses are needed and the measurement sensitivity-linearity trade-off can be more challenging. A setup will be presented and exercised making these measurements up through the E- to D-band range with 200 MHz of instantaneous bandwidth and a noise sensitivity of -75 dBm absolute with a DUT output level of 10 dBm. Several DUT responses will be examined to study the noise distribution with power and signal type.
Keywords :
"Noise measurement","Receivers","Power measurement","Radio frequency","Frequency measurement","Distortion measurement","Bandwidth"
Publisher :
ieee
Conference_Titel :
Integrated Nonlinear Microwave and Millimetre-wave Circuits Workshop (INMMiC), 2015
Type :
conf
DOI :
10.1109/INMMIC.2015.7330347
Filename :
7330347
Link To Document :
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