DocumentCode
3692926
Title
Gallium nitride Schottky and MIS power switch performance comparison for 35 GHz applications
Author
Alessio Pantellini;Antonio Nanni;Andrea Bettidi;Diego Carosi;Donatella Dominijanni;Claudio Lanzieri
Author_Institution
Selex ES, 00131, Rome, Italy
fYear
2015
Firstpage
1
Lastpage
3
Abstract
AlGaN/GaN high electron mobility transistors (HEMTs) have attracted considerable attention on high power - high frequency switch applications. With the aim to optimize the switching performances, in this paper the comparison between traditional Schottky and alternative MIS solution for Single-Pole Double-Throw (SPDT) switching circuit working in the Ka band will be presented, enhancing the benefits of Metal-Insulator-Semiconductor (MIS) technology in terms of DC characteristics and consequently RF Insertion Loss and Isolation, as well as the related FOMs and the full compliance with monolithic HPAs and LNAs integration. Robustness related to maximum power handling will be also presented.
Keywords
"Logic gates","Switches","HEMTs","MODFETs","Insertion loss","Gallium nitride","Aluminum gallium nitride"
Publisher
ieee
Conference_Titel
Integrated Nonlinear Microwave and Millimetre-wave Circuits Workshop (INMMiC), 2015
Type
conf
DOI
10.1109/INMMIC.2015.7330381
Filename
7330381
Link To Document