Title :
Analyzing the Efficiency of L1 Caches for Reliable Hybrid-Voltage Operation Using EDC Codes
Author :
Maric, Bojan ; Abella, Jaume ; Valero, M.R.
Author_Institution :
Barcelona Supercomput. Center, Univ. Politec. de Catalunya, Barcelona, Spain
Abstract :
The increasing demand for highly miniaturized battery-powered ultralow cost systems (e.g., below 1 dollar) in emerging applications such as body, urban life and environment monitoring, and so on, has introduced many challenges in chip design. Such applications require high performance occasionally and very little energy consumption during most of the time to extend battery lifetime. In addition, they require real-time guarantees. Caches have been shown to be the most critical blocks in these systems due to their high energy/area consumption and hard-to-predict behavior. New, simple, hybrid-voltage operation (high Vcc and ultralow Vcc), single-Vcc domain L1 cache architectures based on replacing energy-hungry bitcells (e.g., 10T) by more energy-efficient and smaller cells (e.g., 8T) enhanced with error detection and correction codes have been recently proposed. Such designs provide significant energy and area efficiency without jeopardizing reliability levels to still provide strong performance guarantees. In this brief, we analyze the efficiency of these designs during ultralow voltage operation. We identify the limits of such approaches by finding an energy-optimal voltage region through experimental models. The experimental results show that area efficiency is always achieved in the range 200-400 mV, whereas both energy and area gains occur above 250 mV, i.e., in near-threshold regime.
Keywords :
cache storage; energy consumption; error correction codes; error detection codes; integrated circuit reliability; low-power electronics; EDC codes; L1 caches efficiency analysis; area consumption; battery lifetime; chip design; energy consumption; energy-hungry bitcells; energy-optimal voltage region; error correction codes; error detection codes; hard-to-predict behavior; miniaturized battery-powered ultralow cost systems; reliable hybrid-voltage operation; ultralow voltage operation; voltage 200 mV to 400 mV; Benchmark testing; Computer architecture; Reliability; SRAM cells; Transistors; Very large scale integration; Caches; embedded real-time; low energy; performance guarantees; reliability; reliability.;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2013.2282498