DocumentCode :
3693826
Title :
Residual amplitude modulation and birefringence effects in EOM and AOM-RN
Author :
Viacheslav Baryshev;Ekaterina Aleinikova
Author_Institution :
FGUP VNIIFTRI, Moscow Region, Mendeleevo, Russian Federation
fYear :
2014
fDate :
6/1/2014 12:00:00 AM
Firstpage :
525
Lastpage :
527
Abstract :
AOM-RN, an acousto-optic modulator operating purely in the Raman-Nath diffraction regime, extended the tools employed in laser spectroscopy as optical phase modulators. The comparative analysis of the RAM and birefringence effects in particular case of commercial 20 MHz resonant EOM fabricated by “Thorlabs” and broadband AOM-RN fabricated at “VNIIFTRI” is presented.
Keywords :
"Optical diffraction","Diffraction","Optical polarization","Phase modulation","Optical device fabrication","Crystals","Random access memory"
Publisher :
ieee
Conference_Titel :
European Frequency and Time Forum (EFTF), 2014
Type :
conf
DOI :
10.1109/EFTF.2014.7331553
Filename :
7331553
Link To Document :
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