Title :
Hardware realization of the system for automated current-voltage characteristics measurement for semiconductor devices
Author :
R.V. Zaitsev;M.V. Kirichenko;O.V. Momotenko;O.V. Polezhaeva;D.S. Prokopenko
Author_Institution :
Materials for Electronics and Solar Cells Department, National Technical University “
Abstract :
Measurement and analytical processing of dark and light current-voltage (I–V) characteristics are still basic and most used methods of semiconductor device certification for determining the output, diode parameters and its efficiency. Therefore, the automation of I–V measurement will allow to conduct studies with higher accuracy and less error typical for measurements in manual mode [1].
Conference_Titel :
Applied Physics (YSF), 2015 International Young Scientists Forum on
DOI :
10.1109/YSF.2015.7333225
