Express-method for quality control of cadmuim-zinc telluride crystals for gamma-radiation detectors

We measured parts of dielectric permittivity of CdxZn1−xTe (x = 0,10 − 0,20) crystals in the dark and during the excitation with white light. It is ascertained that all investigated values correlate with energy resolution of detectors manufactured from these crystals, especially increments of dielectric parameters at the light. Correlation between dialectical properties and energy resolution of detectors is explained by determining influence on this value of intrinsic structural defects formed with cadmium vacancies. We propose a new rapid method for estimation of conformance to requirements for the manufacturing of ionizining radiation detectors based on this fact.