• DocumentCode
    3694836
  • Title

    Vth self-adjusting tri-gate nanowire MOSFET for stability improvement of SRAM cell operating at 0.1 V

  • Author

    Seung-Min Jung;Takuya Saraya;Kiyoshi Takeuchi;Masaharu Kobayashi;Toshiro Hiramoto

  • Author_Institution
    Institute of Industrial Science, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    A tri-gate nanowire MOSFET with Vth self-adjustment mechanism is proposed and its operation is successfully demonstrated. In this device, Vth increases at off-state and Vth decreases at on-state. The fabricated device shows excellent subthreshold characteristics due to nanowire channel and exhibits clear Vth self-adjustment at ultra-low Vdd as low as 0.1V. Additionally, by circuit simulation based on the measured device, stability improvement of an SRAM cell is shown at Vdd = 0.1 V thanks to the Vth self-adjustment.
  • Keywords
    Decision support systems
  • Publisher
    ieee
  • Conference_Titel
    SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2015 IEEE
  • Type

    conf

  • DOI
    10.1109/S3S.2015.7333493
  • Filename
    7333493