• DocumentCode
    3694842
  • Title

    Robust subthreshold level conversion

  • Author

    Joseph Lin;Antonio Soares;Steven Vitale

  • Author_Institution
    MIT Lincoln Laboratory, Lexington, MA
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    We describe a robust level converter that is capable of converting up to 1.2V from a subthreshold input voltage of 60mV. Measurement results are given for test circuits fabricated in a 90nm FDSOI subthreshold optimized process.
  • Keywords
    "MOSFET","Robustness","Logic gates","Implants","Threshold voltage","Standards"
  • Publisher
    ieee
  • Conference_Titel
    SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2015 IEEE
  • Type

    conf

  • DOI
    10.1109/S3S.2015.7333499
  • Filename
    7333499
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3694842