DocumentCode :
3695725
Title :
Prediction of shunt malfunction of track circuit based on PSO-SVM
Author :
Mengqi-Zhang; Huibing-Zhao
Author_Institution :
Beijing Jiaotong University, China
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Firstpage :
1783
Lastpage :
1787
Abstract :
Shunt malfunction of track circuit is the important factor that affects the efficiency and safety of railway transportation. In this paper, the influences to induced current which caused by shunt malfunction has been analyzed based on track circuit theoretical model and the wavelet decomposition and reconstruction algorithm was used to compare and analyze the detail component of the current both in the normal condition and shunt malfunction condition. The prediction accuracy rate can be as high as 99.5% with the prediction model.
Keywords :
"Predictive models","Integrated circuit modeling","Support vector machines","Insulation life","Degradation","Accuracy","Wheels"
Publisher :
ieee
Conference_Titel :
Industrial Electronics and Applications (ICIEA), 2015 IEEE 10th Conference on
Type :
conf
DOI :
10.1109/ICIEA.2015.7334400
Filename :
7334400
Link To Document :
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