Title :
Reconfigured multichip-on-wafer (mCoW) Cu/oxide hybrid bonding technology for ultra-high density 3D integration using recessed oxide, thin glue adhesive, and thin metal capping layers
Author :
K.W. Lee;C. Nagai;A. Nakamura;H. Aizawa;J.C. Bea;M. Koyanagi;H. Hashiguchi;T. Fukushima;T. Tanaka
Author_Institution :
New Industry Creation Hatchery Center (NICHe), Tohoku University, Sendai, 980-8579, Japan
Abstract :
High yield reconfigured multichip-on-wafer (mCoW) Cu/oxide hybrid bonding technology is proposed for ultra-high density 2.5D/3D integration applications. New mCoW hybrid bonding technology use shallow-recess oxide structure, electro-less plated capping layers, and thin glue adhesive layer below 1um to avoid the issues of current standard CoW bonding technology. Multi numbers of TEG die with 7mm × 23mm size are simultaneously aligned with high accuracy around 1um using chip self-assembly technology and thermal-compression bonded by in batch. In the TEG chip, totally 684,000 electrode daisy chain comprising of 3um diameter/6um pitch tiny Cu electrodes are well intact joined by new reconfigured mCoW hybrid bonding technology.
Keywords :
"Electrodes","Bonding","Three-dimensional displays","Metals","Conferences","Plasmas","Plating"
Conference_Titel :
3D Systems Integration Conference (3DIC), 2015 International
DOI :
10.1109/3DIC.2015.7334471