DocumentCode :
3695880
Title :
Power saving and noise reduction of 28nm CMOS RF system integration using integrated fan-out wafer level packaging (InFO-WLP) technology
Author :
Chuei-Tang Wang;Jeng-Shien Hsieh;Victor C. Y. Chang;En-Hsiang Yeh;Feng-Wei Kuo;Hsu-Hsien Chen;Chih-Hua Chen;Ron Chen;Ying-Ta Lu;Chewn-Pu Jou;Hao-Yi Tsai;C. S. Liu;Doug C. H. Yu
Author_Institution :
Research and Development, Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, Taiwan, R. O. C.
fYear :
2015
Abstract :
An integration of 28 nm CMOS RF system with 3D solenoidal inductors (3DSI) in integrated fan-out (InFO) wafer level package technology is studied. The 3DSI provides the performance of Q-factor of 51 and isolation of −53 dB. With the 3DSI, the RF system in the InFO technology results in power saving by 58% and noise reduction by 80% in LNA and VCO, respectively, compared with those in RF SoC system. The InFO technology provides a novel solution for RF system integration.
Keywords :
"CMOS integrated circuits","Radio frequency","Inductors","Yttrium","Resonant frequency","System integration","Substrates"
Publisher :
ieee
Conference_Titel :
3D Systems Integration Conference (3DIC), 2015 International
Type :
conf
DOI :
10.1109/3DIC.2015.7334573
Filename :
7334573
Link To Document :
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