DocumentCode :
36970
Title :
Analysis of an Open-Loop Time Amplifier With a Time Gain Determined by the Ratio of Bias Current
Author :
Hye-Jung Kwon ; Jae-Seung Lee ; Byungsub Kim ; Jae-Yoon Sim ; Hong-June Park
Author_Institution :
Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., Pohang, South Korea
Volume :
61
Issue :
7
fYear :
2014
fDate :
Jul-14
Firstpage :
481
Lastpage :
485
Abstract :
Analysis of an open-loop time amplifier shows good agreement between measurements and calculations on the time gain, distortion of time gain, and rms noise and offset of output time difference. The time amplifier is based on the slew rate control method. It achieves a large time gain up to 120 and a wide range of input time difference up to 2 ns. The circuit consists of two precharged capacitors and current sources, where one capacitor is discharged at a fast slew rate during the time interval of the input time difference and then both capacitors are discharged at the same slow slew rate. The time gain is simply determined by the ratio of two bias current values. The proposed time amplifier is followed by an 8-bit TDC to obtain the digital output code. The time gain distortion caused by channel length modulation is less than 1.6% for the input time difference larger than 100 ps. The time offset and the rms noise of output time difference are inversely proportional to the smaller bias current. The rms noise is dominated by the noise of the comparator reference voltage. The time amplifier and TDC consume 0.36 mW and 1 mW, respectively, at 1.2 V supply in a 0.13 μm CMOS process.
Keywords :
CMOS analogue integrated circuits; amplifiers; capacitors; comparators (circuits); constant current sources; integrated circuit noise; modulation; time-digital conversion; CMOS process; TDC; channel length modulation; comparator reference voltage; current source; digital output code; open-loop time amplifier analysis; output time difference offset; power 0.36 mW; power 1 mW; precharged capacitor; rms noise; size 0.13 mum; slew rate control method; time gain distortion; time-to-digital converter; voltage 1.2 V; word length 8 bit; Distortion measurement; Mathematical model; Noise; Time measurement; Tin; Transient analysis; Transistors; Gain control; high resolution Time to Digital Converter (TDC); open loop; slew rate control; time amplifier; wide input range;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2014.2328800
Filename :
6825871
Link To Document :
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