Title :
2015 Compendium of Recent Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory´s Radiation Effects Group
Author :
Gregory R. Allen;Leif Z. Scheick;Farokh Irom;Steven M. Guertin;Philippe C. Adell;Mehran Amrbar;Sergeh Vartanian;Michael O´Connor
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fDate :
7/1/2015 12:00:00 AM
Abstract :
This paper reports heavy ion, proton, and laser induced single event effects (SEE) results for a variety of microelectronic devices targeted for possible use in JPL spacecraft. The compendium covers devices tested within the timeframe of August 2012 through February 2015. It is an update to the SEE compendia JPL has historically published.
Keywords :
"Protons","Propulsion","Radiation effects","Testing","Performance evaluation","Microelectronics","SDRAM"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN :
978-1-4673-7641-9
DOI :
10.1109/REDW.2015.7336703
