• DocumentCode
    3697261
  • Title

    Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA

  • Author

    Michael J. Campola;Donna J. Cochran;Alvin J. Boutte;Dakai Chen;Robert A. Gigliuto;Kenneth A. LaBel;Jonathan A. Pellish;Raymond L. Ladbury;Megan C. Casey;Edward P. Wilcox;Martha V. O´Bryan;Jean-Marie Lauenstein;Dan Violette;Michael A. Xapsos

  • Author_Institution
    NASA Goddard Space Flight Center, Greenbelt, MD, USA
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    Total ionizing dose and displacement damage testing is performed to characterize and determine the suitability of candidate electronics for NASA spacecraft and program use.
  • Keywords
    "Degradation","Electronic mail","Transistors","Protons","Operational amplifiers","NASA","Green products"
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2015 IEEE
  • Print_ISBN
    978-1-4673-7641-9
  • Type

    conf

  • DOI
    10.1109/REDW.2015.7336705
  • Filename
    7336705
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3697261