• DocumentCode
    3697262
  • Title

    Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial Digital to Analog Converters

  • Author

    Farokh Irom;Shri G. Agarwal

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol. Pasadena, Pasadena, CA, USA
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper reports single-event latchup and total ionizing dose results for a variety of digital to analog converters targeted for possible use in NASA spacecraft. It covers devices tested over the last 15 years.
  • Keywords
    "Conferences","Temperature measurement","Degradation","CMOS integrated circuits","Performance evaluation","BiCMOS integrated circuits","Propulsion"
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2015 IEEE
  • Print_ISBN
    978-1-4673-7641-9
  • Type

    conf

  • DOI
    10.1109/REDW.2015.7336706
  • Filename
    7336706
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3697262