Title :
ELDRS Characterization up to 300 Krad of Texas Instruments High Speed Amplifiers, LM7171 and LM6172
Author :
Kirby Kruckmeyer;Thang Trinh
Author_Institution :
Texas Instrum., Santa Clara, CA, USA
fDate :
7/1/2015 12:00:00 AM
Abstract :
Texas Instruments´ LM7171 (5962F9553602VXA) was tested to 300 krad and LM6172 (5962R9560403VXA) was tested to 200 krad at a dose rate of 10 mrad/s. Testing to 300 krad took one year. Both products were ELDRS free.
Keywords :
"Testing","Radiation effects","Gain","Feedback amplifiers","Pins","Distortion","Electronic mail"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN :
978-1-4673-7641-9
DOI :
10.1109/REDW.2015.7336707
