• DocumentCode
    3697270
  • Title

    Heavy Ion Single Event Effects Measurements of Xilinx Zynq-7000 FPGA

  • Author

    Mehran Amrbar;Farokh Irom;Steven M. Guertin;Greg Allen

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Heavy ion single-event effect (SEE) measurements on Xilinx Zynq-7000 are reported. Heavy ion susceptibility to Single-Event latchup (SEL), single event upsets (SEUs) of BRAM, configuration bits of FPGA and on chip memory (OCM) of the processor were investigated.
  • Keywords
    "Field programmable gate arrays","Software","Testing","Registers","Single event upsets","Logic gates","Radiation effects"
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2015 IEEE
  • Print_ISBN
    978-1-4673-7641-9
  • Type

    conf

  • DOI
    10.1109/REDW.2015.7336714
  • Filename
    7336714
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3697270