Title :
Impact of Temperature and Vcc Variation on 20nm Kintex UltraScale FPGAs Neutron Soft Error Rate
Author :
Pierre Maillard;Michael Hart;Jeff Barton;Praful Jain;James Karp
Author_Institution :
Xilinx Inc., San Jose, CA, USA
fDate :
7/1/2015 12:00:00 AM
Abstract :
The single-event response vs. temperature and Vcc supply voltage of the 20nm Kintex UltraScale FPGA is characterized using a 64 MeV proton beam as proxy for atmospheric neutron. Single-event upset and multi-bit upset results are presented.
Keywords :
"Field programmable gate arrays","Single event upsets","Ocean temperature","Random access memory","Protons","Temperature measurement","Heating"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN :
978-1-4673-7641-9
DOI :
10.1109/REDW.2015.7336718
