• DocumentCode
    3697274
  • Title

    Impact of Temperature and Vcc Variation on 20nm Kintex UltraScale FPGAs Neutron Soft Error Rate

  • Author

    Pierre Maillard;Michael Hart;Jeff Barton;Praful Jain;James Karp

  • Author_Institution
    Xilinx Inc., San Jose, CA, USA
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The single-event response vs. temperature and Vcc supply voltage of the 20nm Kintex UltraScale FPGA is characterized using a 64 MeV proton beam as proxy for atmospheric neutron. Single-event upset and multi-bit upset results are presented.
  • Keywords
    "Field programmable gate arrays","Single event upsets","Ocean temperature","Random access memory","Protons","Temperature measurement","Heating"
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2015 IEEE
  • Print_ISBN
    978-1-4673-7641-9
  • Type

    conf

  • DOI
    10.1109/REDW.2015.7336718
  • Filename
    7336718