• DocumentCode
    3697286
  • Title

    Radiation Test Results for Common CubeSat Microcontrollers and Microprocessors

  • Author

    Steven M. Guertin;Mehran Amrbar;Sergeh Vartanian

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    SEL, SEU, and TID results are presented for microcontrollers and microprocessors of interest for small satellite systems such as the TI MSP430F1611, MSP430F1612 and MSP430FR5739, Microchip PIC24F256GA110 and dsPIC33FJ256GP710, Atmel AT91SAM9G20, and Intel Atom E620T, and the Qualcomm Snapdragon APQ8064.
  • Keywords
    "Testing","Random access memory","Performance evaluation","Microcontrollers","Radiation effects","Light emitting diodes","Propulsion"
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2015 IEEE
  • Print_ISBN
    978-1-4673-7641-9
  • Type

    conf

  • DOI
    10.1109/REDW.2015.7336730
  • Filename
    7336730
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3697286