Title :
Radiation Test Results for Common CubeSat Microcontrollers and Microprocessors
Author :
Steven M. Guertin;Mehran Amrbar;Sergeh Vartanian
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fDate :
7/1/2015 12:00:00 AM
Abstract :
SEL, SEU, and TID results are presented for microcontrollers and microprocessors of interest for small satellite systems such as the TI MSP430F1611, MSP430F1612 and MSP430FR5739, Microchip PIC24F256GA110 and dsPIC33FJ256GP710, Atmel AT91SAM9G20, and Intel Atom E620T, and the Qualcomm Snapdragon APQ8064.
Keywords :
"Testing","Random access memory","Performance evaluation","Microcontrollers","Radiation effects","Light emitting diodes","Propulsion"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN :
978-1-4673-7641-9
DOI :
10.1109/REDW.2015.7336730
