Title :
SEE Testing of the Intersil ISL71840SEH 16-Channel Analog Multiplexer
Author :
N. W. van Vonno;L. G. Pearce;K. S. Bernard;E. J. Thomson
Author_Institution :
Intersil Corp., Palm Bay, FL, USA
fDate :
7/1/2015 12:00:00 AM
Abstract :
We report the results of destructive and nondestructive heavy ion single-event effects (SEE) testing of the Intersil ISL71840SEH hardened 16-channel analog multiplexer, prefaced by a brief discussion of its functionality, electrical specifications and fabrication process.
Keywords :
"Testing","Multiplexing","Gold","Monitoring","Switches","Cyclotrons","Temperature measurement"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN :
978-1-4673-7641-9
DOI :
10.1109/REDW.2015.7336731
