Title :
SET and SEFI Characterization of the 65 nm SmartFusion2 Flash-Based FPGA under Heavy Ion Irradiation
Author :
Nadia Rezzak;Durwyn Dsilva;Jih-Jong Wang;Narayan Jat
Author_Institution :
Microsemi SOC, San Jose, CA, USA
fDate :
7/1/2015 12:00:00 AM
Abstract :
SET and SEFI characterization of the SmartFusion2 flash-based FPGA under heavy ion irradiation is presented. Functional blocks such as the PLL and Microcontroller Sub System are characterized and presented.
Keywords :
"Phase locked loops","Fabrics","Flip-flops","Field programmable gate arrays","Clocks","Microcontrollers","Testing"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN :
978-1-4673-7641-9
DOI :
10.1109/REDW.2015.7336733
