• DocumentCode
    3697292
  • Title

    Single-Event Characterization of the 20 nm Xilinx Kintex UltraScale Field-Programmable Gate Array under Heavy Ion Irradiation

  • Author

    David S. Lee;Gregory R. Allen;Gary Swift;Matthew Cannon;Michael Wirthlin;Jeffrey S. George;Rokutaro Koga;Kangsen Huey

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This study examines the single-event response of the Xilinx 20 nm Kintex UltraScale Field-Programmable Gate Array irradiated with heavy ions. Results for single-event latch-up and single-event upset on configuration SRAM cells and Block RAM memories are provided.
  • Keywords
    "Random access memory","Testing","Field programmable gate arrays","Radiation effects","Monitoring","Ions","Protons"
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2015 IEEE
  • Print_ISBN
    978-1-4673-7641-9
  • Type

    conf

  • DOI
    10.1109/REDW.2015.7336736
  • Filename
    7336736
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3697292