Title :
TID and SEE Characterization of Microsemi´s 4th Generation Radiation Tolerant RTG4 Flash-Based FPGA
Author :
Nadia Rezzak;Jih-Jong Wang;Durwyn Dsilva;Narayan Jat
Author_Institution :
Microsemi SOC, San Jose, CA, USA
fDate :
7/1/2015 12:00:00 AM
Abstract :
TID and SEE characterization of Microsemi´s 4th generation RTG4 flash-based FPGA is presented. The radiation performance of RTG4 is compared to SmartFusion2, Microsemi´s 4th generation commercial flash-based FPGA.
Keywords :
"Field programmable gate arrays","Random access memory","Transistors","Threshold voltage","Power supplies","Switching circuits","Logic gates"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN :
978-1-4673-7641-9
DOI :
10.1109/REDW.2015.7336739
