• DocumentCode
    3697324
  • Title

    Challenges of fulfilling the promise of tunnel FETs

  • Author

    S. Datta;R. Pandey

  • Author_Institution
    The Pennsylvania State University, University Park, PA 16802, USA
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    III-V Hetero-junction Tunnel FET (HTFET) are promising candidates for supply voltage scaling down to sub-0.5V due to their promise of sub-kT/q switching without compromising on-current (ION). Recently n-type III-V HTFET with reasonable ION and sub-kT/q switching at VDS=0.5V have been demonstrated [1]. However, steep switching performance of III-V HTFET till date has been limited to range of drain current (IDS) spanning over less than a decade. Here, we analyze primary roadblocks in the path towards achieving steep switching performance in III-V HTFET. Temperature dependent current-voltage measurements on III-V HTFET are performed and calibrated numerical simulations are used to quantify the metrics towards realizing sub-kT/q switching over large IDS range.
  • Keywords
    "Switches","Field effect transistors","Temperature dependence","Temperature measurement","Junctions","Logic gates","Integrated circuit modeling"
  • Publisher
    ieee
  • Conference_Titel
    Energy Efficient Electronic Systems (E3S), 2015 Fourth Berkeley Symposium on
  • Type

    conf

  • DOI
    10.1109/E3S.2015.7336799
  • Filename
    7336799