Title :
An on-chip stochastic sigma-tracking eye-opening monitor for BER-optimal adaptive equalization
Author :
Hyosup Won;Kwangseok Han;Sangeun Lee;Jinho Park;Hyeon-min Bae
Author_Institution :
Department of Electrical Engineering, KAIST, Daejeon, Korea
Abstract :
An on-chip stochastic sigma-tracking eye-opening monitor (SSEOM) for background adaptive equalization is presented. The proposed SSEOM detects the BER-related eye opening area accurately with a feasible degree of time/area efficiency without an external microcontroller. In addition, the SSEOM determines the BER-optimal equalization parameters for both CTLE and DFE by incorporating a pattern-dependent eye-tracking scheme. Auxiliary data samplers are employed in parallel with data samplers to track link variations and adjust the equalization parameters in the background. A 28-Gb/s CDR including a SSEOM-based adaptive equalizer is fabricated in 40nm CMOS for an evaluation.
Keywords :
"Decision support systems","Indexes"
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2015 IEEE
DOI :
10.1109/CICC.2015.7338374