DocumentCode :
3698534
Title :
A 30.1μm2, < ±1.1°C-3σ-error, 0.4-to-1.0V temperature sensor based on direct threshold-voltage sensing for on-chip dense thermal monitoring
Author :
Seongjong Kim;Mingoo Seok
Author_Institution :
Columbia University, New York, NY, USA
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents on-chip temperature sensor circuits for dense thermal monitoring in digital VLSI systems. The sensor directly captures the temperature dependency of threshold voltage. The prototype in a 65nm demonstrates that as compared to the state of the arts it can achieve a 9× smaller footprint of 30.1μm2 and a 3× smaller 3σ-error of <±1.1°C after one temperature point calibration. The proposed sensor also achieves a 0.2V better voltage scalability than the previous best voltage-scalable design.
Keywords :
"Temperature sensors","Monitoring","Very large scale integration","Temperature dependence","Threshold voltage"
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2015 IEEE
Type :
conf
DOI :
10.1109/CICC.2015.7338397
Filename :
7338397
Link To Document :
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