Title :
The laboratory facility and testing methods memristor structures
Author :
Nikita Permiakov;Alexander Ivanov;Vyacheslav Moshnikov
Author_Institution :
Saint-Petersburg Electrotechnical University “
Abstract :
Recent advances in information technology require higher-speed and higher-density memory devices. Testing and development of the technology of these devices is a complex task. The paper presents the option of using an electron microscope and setup for measuring electrical parameters.
Keywords :
"Memristors","Aluminum oxide","Electrodes","Atomic layer deposition","Electric breakdown","Testing","Gold"
Conference_Titel :
"Stability and Control Processes" in Memory of V.I. Zubov (SCP), 2015 International Conference
DOI :
10.1109/SCP.2015.7342088
