DocumentCode :
3701689
Title :
Generalization of an outlier model into a “global” perspective
Author :
Sebastian Siatkowski;Chia-Ling Chang;Li-C. Wang;Nikolas Sumikawa;LeRoy Winemberg;W. Robert Daasch
Author_Institution :
University of California, Santa Barbara
fYear :
2015
Firstpage :
1
Lastpage :
10
Abstract :
In this work, we study the generalization of an outlier model from two perspectives, temporal and spatial. We show that model generalization with existing distribution-based outlier analysis methods can vary significantly. We then propose a “big data” outlier analysis approach together with a probability-based outlier evaluation for improving model generalization. Experiments are conducted based on two automotive product lines to explain the concepts and demonstrate the effectiveness of the proposed approach.
Keywords :
"Semiconductor device modeling","Uncertainty","Analytical models","Robustness","Semiconductor device measurement","Linear regression","Production"
Publisher :
ieee
Conference_Titel :
Test Conference (ITC), 2015 IEEE International
Type :
conf
DOI :
10.1109/TEST.2015.7342396
Filename :
7342396
Link To Document :
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