• DocumentCode
    3701700
  • Title

    A case study: Leverage IEEE 1687 based method to automate modeling, verification, and test access for embedded instruments in a server processor

  • Author

    Tassanee Payakapan;Senwen Kan;Ken Pham;Kathy Yang;J-F Cote;Martin Keim;Jennifer Dworak

  • Author_Institution
    Advanced Micro Devices
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    IEEE 1149.1-based top-level access to IEEE 1500-compliant IP cores is commonly used in industrial designs as the underlying infrastructure to provide test access, control, instrumentation, and ease of use. Validating the test infrastructure and its usage in the early design stages is critical to the success of the project. The new Internal Joint Test Action Group (IJTAG or IEEE 1687-2014) standard is a valuable component of this test infrastructure and is designed to promote efficient embedded instrument access. This paper describes one of first comprehensive applications of an IJTAG-based method to a state-of-the-art server microprocessor design from specification to production. We leveraged IJTAG to automate design modeling, enable faster and more advanced verification, and optimize manufacturing test access. In this work, we demonstrate a very high degree of optimization and automation, which is cost-efficiently enabled by IJTAG, and goes beyond the capabilities of typical in-house IJTAG-like system, currently in use in industry.
  • Keywords
    "Instruments","Registers","Automatic test pattern generation","IP networks","Standards","Ports (Computers)"
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2015 IEEE International
  • Type

    conf

  • DOI
    10.1109/TEST.2015.7342407
  • Filename
    7342407