DocumentCode
3701700
Title
A case study: Leverage IEEE 1687 based method to automate modeling, verification, and test access for embedded instruments in a server processor
Author
Tassanee Payakapan;Senwen Kan;Ken Pham;Kathy Yang;J-F Cote;Martin Keim;Jennifer Dworak
Author_Institution
Advanced Micro Devices
fYear
2015
Firstpage
1
Lastpage
10
Abstract
IEEE 1149.1-based top-level access to IEEE 1500-compliant IP cores is commonly used in industrial designs as the underlying infrastructure to provide test access, control, instrumentation, and ease of use. Validating the test infrastructure and its usage in the early design stages is critical to the success of the project. The new Internal Joint Test Action Group (IJTAG or IEEE 1687-2014) standard is a valuable component of this test infrastructure and is designed to promote efficient embedded instrument access. This paper describes one of first comprehensive applications of an IJTAG-based method to a state-of-the-art server microprocessor design from specification to production. We leveraged IJTAG to automate design modeling, enable faster and more advanced verification, and optimize manufacturing test access. In this work, we demonstrate a very high degree of optimization and automation, which is cost-efficiently enabled by IJTAG, and goes beyond the capabilities of typical in-house IJTAG-like system, currently in use in industry.
Keywords
"Instruments","Registers","Automatic test pattern generation","IP networks","Standards","Ports (Computers)"
Publisher
ieee
Conference_Titel
Test Conference (ITC), 2015 IEEE International
Type
conf
DOI
10.1109/TEST.2015.7342407
Filename
7342407
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