DocumentCode :
3701886
Title :
Negative phase shift in a layered metal-dielectric structure: Theory and experiment
Author :
A. Agashkov;V. Belyi;M. A. Binhussain;N. Kazak;V. Agabekov;N. Khilo
Author_Institution :
The Institute of Physics of NAS Belarus, 68 Nezalezhnasti Ave., 220072, Minsk, Belarus
fYear :
2015
Firstpage :
25
Lastpage :
27
Abstract :
Measurements of the negative optical phase shifts of Ag/TiO2 and Ag/SiO2 bilayer films have been carried out with the modified walk-off interferometer. Appearance and monotonic rise of the phase shift anisotropy for p- and s-polarization by increasing incidence angle has been revealed experimentally. The results of measurements have shown rather good coincidence with theoretical calculations.
Keywords :
"Optical interferometry","Phase shifting interferometry","Measurement by laser beam","Optical variables measurement","Phase measurement","Optical films"
Publisher :
ieee
Conference_Titel :
Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS), 2015 9th International Congress on
Type :
conf
DOI :
10.1109/MetaMaterials.2015.7342597
Filename :
7342597
Link To Document :
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