• DocumentCode
    3704376
  • Title

    WR-5.1 band, on-wafer characterization at cryogenic temperatures

  • Author

    David R. Daughton;Doug McLean;Scott Yano;Alessandro Macor;Emile de Rijk;Arndt von Bieren;Mirko Favre;Matthew Bauwens;Arthur Lichtenberger;N. Scott Barker;Robert M. Weikle;Jeffrey L. Hesler;Cliff Rowland;Eric Bryerton

  • Author_Institution
    Lake Shore Cryotronics, Inc., Westerville, OH USA
  • fYear
    2015
  • Firstpage
    319
  • Lastpage
    322
  • Abstract
    On-wafer probing measurements are demonstrated using a novel cryogenic probe station operating in the WR-5.1 band using corrugated waveguides and at temperatures below 30 K.
  • Keywords
    "Probes","Cryogenics","Millimeter wave measurements","Waveguide components","Rectangular waveguides"
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2015 European
  • Type

    conf

  • DOI
    10.1109/EuMC.2015.7345764
  • Filename
    7345764
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3704376