A fast rotating scanning approach for millimeter wave imaging

Millimeter wave imaging technologies offer a wide spectrum of new applications. Research results of the last year´s show, that millimeter waves can be used to detect letter bombs and non-metallic impurities inside products or can be used to control material parameters in real-time applications to detect fluctuations during the production. The main challenge for an operational system is the development of fast and cheap scanner concepts for this frequency range.