• DocumentCode
    3705445
  • Title

    Intelligent rapid investigation of S-parameters (IRIS)

  • Author

    Nikita Ambasana;Bhyrav Mutnury;Dipanjan Gope

  • Author_Institution
    Department of Electrical Communication Engineering, Indian Institute of Science, Bangalore, India
  • fYear
    2015
  • Firstpage
    63
  • Lastpage
    66
  • Abstract
    IRIS is a consolidated platform to analyse bulk S-Parameter data, perform operations like termination/renormalization of port impedances, conversion from single-ended to mixed mode, evaluate complex equations in S-Parameters, plug-in, view and record violation of envelopes as defined by SATA, SAS, PCIe & USB spec sheets. It also implements a novel machine-learning based methodology [1] to efficiently bridge Frequency Domain (FD) and Time Domain (TD) by predicting Eye-Height (EH) and Eye-Widths (EW) from S-Parameters.
  • Keywords
    "Scattering parameters","Iris","Measurement","Mathematical model","Ports (Computers)","Artificial neural networks","Silicon"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2015 IEEE 24th
  • Print_ISBN
    978-1-5090-0038-8
  • Type

    conf

  • DOI
    10.1109/EPEPS.2015.7347130
  • Filename
    7347130
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3705445