• DocumentCode
    3705476
  • Title

    Return loss characterization and analysis of high-speed serial interface

  • Author

    Wendemagegnehu T. Beyene;Chris Madden;Nikhil Vaidya;Hai Lan

  • Author_Institution
    Rambus Inc., 1050 Enterprise Way, Sunnyvale, CA 94089, USA
  • fYear
    2015
  • Firstpage
    203
  • Lastpage
    206
  • Abstract
    This paper describes the return loss characterization and analysis of a high-speed serial interface with T-coils at the transmitter and receiver. Today´s high-speed links utilize equalization to mitigate channel loss and dispersion. In addition, T-coil networks are used at inputs and outputs to improve impedance matching and to enhance the receiver and transmitter bandwidth. To guarantee the transceiver performance, a wide range of Serializer Deserializer (SerDes) compliance specifications exist for the return loss measured at or near the package interface and the Printed Circuit Board (PCB). For multi-protocol SerDes, thus, T-coil networks are often necessary to meet the most stringent return loss specification. This paper presents the analysis and characterization of a high-speed transceiver with T-coils designed in a 28 nm CMOS process. Measurements are also presented to demonstrate the improvement in return loss and bandwidth of the transceiver.
  • Keywords
    "Loss measurement","Receivers","Transmitters","Propagation losses","Transceivers","Fixtures","Transmission line measurements"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2015 IEEE 24th
  • Print_ISBN
    978-1-5090-0038-8
  • Type

    conf

  • DOI
    10.1109/EPEPS.2015.7347162
  • Filename
    7347162