DocumentCode :
3705476
Title :
Return loss characterization and analysis of high-speed serial interface
Author :
Wendemagegnehu T. Beyene;Chris Madden;Nikhil Vaidya;Hai Lan
Author_Institution :
Rambus Inc., 1050 Enterprise Way, Sunnyvale, CA 94089, USA
fYear :
2015
Firstpage :
203
Lastpage :
206
Abstract :
This paper describes the return loss characterization and analysis of a high-speed serial interface with T-coils at the transmitter and receiver. Today´s high-speed links utilize equalization to mitigate channel loss and dispersion. In addition, T-coil networks are used at inputs and outputs to improve impedance matching and to enhance the receiver and transmitter bandwidth. To guarantee the transceiver performance, a wide range of Serializer Deserializer (SerDes) compliance specifications exist for the return loss measured at or near the package interface and the Printed Circuit Board (PCB). For multi-protocol SerDes, thus, T-coil networks are often necessary to meet the most stringent return loss specification. This paper presents the analysis and characterization of a high-speed transceiver with T-coils designed in a 28 nm CMOS process. Measurements are also presented to demonstrate the improvement in return loss and bandwidth of the transceiver.
Keywords :
"Loss measurement","Receivers","Transmitters","Propagation losses","Transceivers","Fixtures","Transmission line measurements"
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2015 IEEE 24th
Print_ISBN :
978-1-5090-0038-8
Type :
conf
DOI :
10.1109/EPEPS.2015.7347162
Filename :
7347162
Link To Document :
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