Title :
Coding and Detection for Channels With Written-In Errors and Inter-Symbol Interference
Author :
Guojun Han ; Yong Liang Guan ; Kui Cai ; Kheong Sann Chan ; Lingjun Kong
Author_Institution :
Sch. of Inf. Eng., Guangdong Univ. of Technol., Guangzhou, China
Abstract :
Written-in errors (WIEs), which include written-in substitutions, insertions, and deletions, as well as 2-D inter-symbol interference (2-D-ISI), form one of the major challenges for the new emerging bit-patterned media recording technology. Coding and detection scheme with performance/complexity tradeoffs is expected to address such a challenge. In this paper, a new channel model with WIEs and ISI (WIE-ISI) is presented, and the embedded marker code scheme (EMCS) with Bahl-Cocke-Jelinek-Raviv (BCJR) detector is employed to perform channel detection. By investigating the effect of ISI on the WIE-ISI channel considering BCJR detector, a virtual written-in substitution probability is introduced and a new synchronization algorithm with written-in substitution detection (SA-WSD) is developed. The EMCS employing the proposed SA-WSD demonstrates better error correction performance than that of the original SA. Furthermore, the SA-WSD is found to be robust to small estimation errors in the written-in substitution probability.
Keywords :
channel coding; error correction; intersymbol interference; magnetic recording; synchronisation; 2D intersymbol interference; Bahl-Cocke-Jelinek-Raviv detector; bit-patterned media recording technology; channel detection; channel model; coding scheme; embedded marker code scheme; error correction performance; estimation errors; intersymbol interference effect; performance-complexity tradeoffs; synchronization algorithm; virtual written-in substitution probability; written-in errors; written-in substitution detection; Decoding; Detectors; Electromagnetic compatibility; Interference; Parity check codes; Synchronization; Writing; Bit-patterned media recording (BPMR); inter-symbol interference (ISI); low-density parity-check (LDPC); marker codes; written-in errors (WIEs);
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2014.2328313