Title : 
Probing a single acceptor in a silicon nanotransistor
         
        
            Author : 
Joost van der Heijden;Joe Salfi;Jan A. Mol;Jan Verduijn;Giuseppe C. Tettamanzi;Alex R. Hamilton;Nadine Collaert;Sven Rogge
         
        
            Author_Institution : 
Centre for Quantum Comput. &
         
        
        
            fDate : 
6/1/2014 12:00:00 AM
         
        
        
        
            Abstract : 
We have demonstrated single hole transport through a silicon nano-transistor using an individual boron atom. Holes bound to acceptor atoms in silicon experience a much stronger spin-orbit interaction than electrons bound to donor atoms. This makes them interesting candidates for electric-field controllable qubits. The energy spectrum of the observed single boron atom in the transistor is 4-fold degenerate, which is expected for acceptor atoms in bulk silicon. This offers a unique two-level system of a heavy and light hole state in an already gated structure. The effect of the nanostructure is observed in a change of Landé g-factor compared to ensembles of boron atoms in bulk silicon.
         
        
            Keywords : 
"Silicon","Boron","Atomic measurements","Logic gates","Couplings","Temperature measurement","Stationary state"
         
        
        
            Conference_Titel : 
Silicon Nanoelectronics Workshop (SNW), 2014 IEEE
         
        
            Print_ISBN : 
978-1-4799-5676-0
         
        
        
            DOI : 
10.1109/SNW.2014.7348587