DocumentCode :
3707768
Title :
Comparing feature detectors: A bias in the repeatability criteria
Author :
Ives Rey-Otero;Mauricio Delbracio;Jean-Michel Morel
Author_Institution :
CMLA, ENS-Cachan, France
fYear :
2015
Firstpage :
3024
Lastpage :
3028
Abstract :
Most computer vision application rely on algorithms finding local correspondences between different images. These algorithms detect and compare stable local invariant descriptors centered at scale-invariant keypoints. Because of the importance of the problem, new keypoint detectors and descriptors are constantly being proposed, each one claiming to perform better than the preceding ones. This raises the question of a fair comparison between very diverse methods. This evaluation has been mainly based on a repeatability criterion of the keypoints under a series of image perturbations (blur, illumination, noise, rotations, homotheties, homographies, etc). In this paper, we argue that the classic repeatability criterion is biased favoring algorithms producing redundant overlapped detections. We propose a sound variant of the criterion taking into account the descriptor overlap that seems to invalidate some of the community´s claims of the last ten years.
Keywords :
"Detectors","Feature extraction","Redundancy","Measurement","Graphical models","Distribution functions","Computer vision"
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2015 IEEE International Conference on
Type :
conf
DOI :
10.1109/ICIP.2015.7351358
Filename :
7351358
Link To Document :
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