DocumentCode :
3707816
Title :
Improved fine structure modeling via guided stochastic clique formation in fully connected conditional random fields
Author :
M. J. Shafiee;A. G. Chung;A. Wong;P. Fieguth
Author_Institution :
Vision &
fYear :
2015
Firstpage :
3260
Lastpage :
3264
Abstract :
Markov random fields (MRFs) and conditional random fields (CRFs) are influential tools in image modeling, particularly for applications such as image segmentation. Local MRFs and CRFs utilize local nodal interactions when modeling, leading to excessive smoothness on boundaries (i.e., the short-boundary bias problem). Recently, the concept of fully connected conditional random fields with stochastic cliques (SFCRF) was proposed to enable long-range nodal interactions while addressing the computational complexity associated with fully connected random fields. While SFCRF was shown to provide significant improvements in segmentation accuracy, there were still limitations with the preservation of fine structure boundaries. To address these limitations, we propose a new approach to stochastic clique formation for fully connected random fields (G-SFCRF) that is guided by the structural characteristics of different nodes within the random field. In particular, fine structures surrounding a node are modeled statistically by probability distributions, and stochastic cliques are formed by considering the statistical similarities between nodes within the random fields. Experimental results show that G-SFCRF outperforms existing fully connected CRF frameworks, SFCRF, and the principled deep random field framework for image segmentation.
Keywords :
"Image segmentation","Probability distribution","Silicon","Image color analysis","Standards","Markov processes"
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2015 IEEE International Conference on
Type :
conf
DOI :
10.1109/ICIP.2015.7351406
Filename :
7351406
Link To Document :
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