• DocumentCode
    3708449
  • Title

    Nonlinear relaxational polarization of Al2O3 and HfO2

  • Author

    Laxman Kankate;Herbert Kliem

  • Author_Institution
    Electrical Engineering Physics, Saarland University, Saarbr?cken, Germany
  • fYear
    2015
  • Firstpage
    640
  • Lastpage
    643
  • Abstract
    In order to increase the capacitance density and to minimize leakage currents, high permittivity metal oxides will probably replace silicon oxide in integrated circuits. But the capacitance-voltage curve of metal oxides turns out to be nonlinear and they display a dispersion of the capacitance-frequency behavior. By employing an asymmetric double well potential model with a distribution of distances between the wells resulting from the amorphous structure of the oxides both effects can be interpreted. Between the wells protons fluctuate by tunneling at low temperatures and by thermal activation at higher temperatures.
  • Keywords
    "Capacitance","Aluminum oxide","Protons","Tunneling","Hafnium oxide"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2015 IEEE Conference on
  • Print_ISBN
    978-1-4673-7496-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2015.7352079
  • Filename
    7352079