DocumentCode
3708449
Title
Nonlinear relaxational polarization of Al2O3 and HfO2
Author
Laxman Kankate;Herbert Kliem
Author_Institution
Electrical Engineering Physics, Saarland University, Saarbr?cken, Germany
fYear
2015
Firstpage
640
Lastpage
643
Abstract
In order to increase the capacitance density and to minimize leakage currents, high permittivity metal oxides will probably replace silicon oxide in integrated circuits. But the capacitance-voltage curve of metal oxides turns out to be nonlinear and they display a dispersion of the capacitance-frequency behavior. By employing an asymmetric double well potential model with a distribution of distances between the wells resulting from the amorphous structure of the oxides both effects can be interpreted. Between the wells protons fluctuate by tunneling at low temperatures and by thermal activation at higher temperatures.
Keywords
"Capacitance","Aluminum oxide","Protons","Tunneling","Hafnium oxide"
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena (CEIDP), 2015 IEEE Conference on
Print_ISBN
978-1-4673-7496-5
Type
conf
DOI
10.1109/CEIDP.2015.7352079
Filename
7352079
Link To Document