DocumentCode :
3710647
Title :
Laser micromachining of Circular Transmission Line Model (CTLM) of Al contacts on n-type SiC/Si chips
Author :
N. F. Mohd Nasir;K. A. Hassan;P. W. Leech;G. K. Reeves;A. S. Holland;Y. Wahab;M. Mazalan;P. Tanner
Author_Institution :
Biomedical Electronic Engineering, Universiti Malaysia Perlis, Perlis, Malaysia
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
An array of Circular Transmission Line Model (CTLM) metal contacts was deposited onto the upper surface of the n-SiC/Si chips using laser micromachining as an alternative to standard photolithography technique. Thin epitaxial n-type 3C-SiC/Si chips were used since no current leakage observed in previous studies. Various laser energies were used for the CTLM pattern transfer. Low values of ρc were obtained such 19×10-4 Ωcm2 was produced despite of different rings´ diameters at the lower laser energy strength. However, high laser penetration had caused higher contact resistances approximately 20 times. This is probably attributed to the surface degradation of 3C-SiC.
Keywords :
"Contact resistance","Silicon","Silicon carbide","Micromachining","Electrical resistance measurement","Resistance","Substrates"
Publisher :
ieee
Conference_Titel :
Micro and Nanoelectronics (RSM), 2015 IEEE Regional Symposium on
Type :
conf
DOI :
10.1109/RSM.2015.7355003
Filename :
7355003
Link To Document :
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