Title :
If holm had used a Scanning Tunneling Microscope: What the nanoscientists are teaching us about electrical contacts
Author_Institution :
Moog, Inc., Blacksburg, Virginia, USA
Abstract :
The invention in the 1980s of the Atomic Force and the Scanning Tunneling Microscopes and widespread use of these and other tools since then has led to an explosion in research into the characterization of contact interfaces at the atomic and molecular level, i.e., on the nanoscale. This paper reviews this research and points to areas where this nanoscale research has a significant impact of our understanding of electrical contacts. Areas of consideration include lubrication, surface films, contact resistance, adhesion, and friction.
Keywords :
"Contacts","Films","Numerical models","Lubrication","Tunneling","Microscopy"
Conference_Titel :
Electrical Contacts (Holm), 2015 IEEE 61st Holm Conference on
DOI :
10.1109/HOLM.2015.7355076